D.L. Rath, R. Ravikumar, et al.
Diffusion and Defect Data Pt.B: Solid State Phenomena
As the end of Si CMOS scaling is approaching, III-V compound semiconductors have received renewed attention as the channel materials for future generation CMOS technology. We have reviewed the benefits, the opportunities, and the challenges of III-Vs for digital applications. We have also demonstrated functional enhancement-mode GaAs- , and InGaAs- channel MOSFETs, with high-j gate dielectrics. The results show promise for realizing III-V MOSFETs for future VLSI logic applications.
D.L. Rath, R. Ravikumar, et al.
Diffusion and Defect Data Pt.B: Solid State Phenomena
Mark A. Eriksson, Mark Friesen, et al.
Quantum Information Processing
S.J. Koester, B.-U. Klepser, et al.
DRC 1998
L.J. Huang, J.O. Chu, et al.
VLSI Technology 2001