Characterization of line width variation
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
Based on UV measurements at 157 nm of in-house fluoropolymers we have selected α-trifluoromethylacrylate and norbornene beating a pendant hexafluoroisopropanol group as our building blocks for 157 nm resist polymers. Polymers consisting of these repeat units have an optical density/μm of 3 or below at 157 nm. We have found that the α-trifluoromethylacrylate derivatives conveniently undergo radical copolymerization with norbornenes, which has provided a breakthrough in preparation of our 157 nm resist polymers. This approach offers flexibility and versatility because an acidic moiety or acid-labile group can be placed in either acrylate or norbornene repeat unit. Other platforms of interest include all-acrylic, all-norbornene, and acrylic-styrenic polymers. © 2001 SPIE - The International Society for Optical Engineering.
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
David Cash, Dennis Hofheinz, et al.
Journal of Cryptology
M. Tismenetsky
International Journal of Computer Mathematics
Jianke Yang, Robin Walters, et al.
ICML 2023