Conference paperCharacterization of thin dielectric films as copper diffusion barriers using triangular voltage sweepS. Cohen, J.C. Liu, et al.MRS Spring Meeting 1999
Workshop paperIdentifying Extreme Regimes in Climate-Scale Digital Twins: a RoadmapEloisa BentivegnaBig Data 2022
PaperThermally Developable, Positive Resist Systems with High SensitivityHiroshi Ito, Reinhold SchwalmJES