Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
The mechanistic and parametric complexity of a plasma etching environment often causes confusion and delays in the development of a suitable plasma etching process. This paper is an attempt to alleviate this problem by discussing some of the important physical and chemical phenomena and, where possible, relating these phenomena to apparatus selection and operation. © 1982 Plenum Publishing Corporation.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
C.M. Brown, L. Cristofolini, et al.
Chemistry of Materials
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
Frank Stem
C R C Critical Reviews in Solid State Sciences