Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
Paper
Picosecond backside optical detection of internal signals in flip-chip mounted silicon VLSI circuits
Abstract
We present picosecond backside optical measurements of currents and voltages, propagation delays, and glitches in flip-chip mounted silicon IC's. These signals are shown to compare well with prior circuit simulations, but they showed additional features not easily simulated. © 1992.
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