J. Tersoff
Applied Surface Science
An analytical model for trapping-state photodepopulation measurements in conductor-thin-film-insulator-conductor structures is presented. The external-circuit-current dependence on applied voltage is determined, and it is shown that moments of the spatial distribution of trapped charge in the insulator can be extracted from collected-charge versus applied-field characteristic curves. The photodepopulation technique is compared with more widely used differential-capacitance and phtoemission-current techniques. © 1974 The American Physical Society.
J. Tersoff
Applied Surface Science
T.N. Morgan
Semiconductor Science and Technology
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
David B. Mitzi
Journal of Materials Chemistry