C. Wang, Y.-T. Cui, et al.
Physical Review B - CMMP
Patterning damage in narrow trackwidth spin-valve sensors was studied. The resistance of the sensors increased with the width, while the giant magnetoresistance (GMR) ratio decreased with decreasing width. It was found that sensors patterned using a focused Ar ion beam showed a similar but much greater effect.
C. Wang, Y.-T. Cui, et al.
Physical Review B - CMMP
J.A. Katine, R.E. Fontana, et al.
INTERMAG 2003
Benjamin W. Chui, Timothy D. Stowe, et al.
JMEMS
Z.Z. Bandić, T.R. Albrecht, et al.
IFETC 2004