Yen S. Yee, Lewis M. Terman, et al.
IEEE JSSC
This paper suromarizesthe status and potential of Charge-coupled device (CCD) memories. Cost-performance tradeoffs for serial memories are reviewed, and the CCD chip organizations for slow and fast access systems are discussed. Comparisons are made between CCD and MOS random access memory (RAM) chips on the basis of cell area, support circuits, cell operation, and technology. Copyright © 1976 by The Institute of Electrical and Electronics Engineers, Inc.
Yen S. Yee, Lewis M. Terman, et al.
IEEE JSSC
Lewis M. Terman, Yen S. Yee, et al.
ISSCC 1981
Date J. W. Noorlag, Lewis M. Terman, et al.
IEEE Journal of Solid-State Circuits
George Cheroff, Dale L. Critchlow, et al.
IEEE JSSC