Nicky C.C. Lu, Hu H. Chao, et al.
IEEE Journal of Solid-State Circuits
An MOS comparator circuit capable of detecting difference signals as low as 1 mV in 3 µs has been designed, built, and tested. The circuit does not require high accuracy components or tight control of device parameter tolerances. © 1978, IEEE. All rights reserved.
Nicky C.C. Lu, Hu H. Chao, et al.
IEEE Journal of Solid-State Circuits
Lewis M. Terman
Applied Surface Science
Lewis M. Terman
Proceedings of the IEEE
Floyd O. Arntz, Howard K. Rockstad, et al.
ISSCC 1976