Lewis M. Terman
Proceedings of the IEEE
An MOS comparator circuit capable of detecting difference signals as low as 1 mV in 3 µs has been designed, built, and tested. The circuit does not require high accuracy components or tight control of device parameter tolerances. © 1978, IEEE. All rights reserved.
Lewis M. Terman
Proceedings of the IEEE
Andrew S. Grove, Lewis M. Terman
ISSCC 1975
Lewis M. Terman
ISSCC 1975
Toshiaki Kirihata, Sang H. Dhong, et al.
IEEE Journal of Solid-State Circuits