Paper
The DX centre
T.N. Morgan
Semiconductor Science and Technology
The out-of-plane thermal expansion coefficient α⊥ of biphenyldianhydride-phenylenediamine (BPDA-PDA) polyimide thin film between 20 and 400°C has been measured using a laser spot scanning interferometer. The α⊥ varies from 100 ppm/°C at 20°C to 400 ppm/°C at 400°C. As the result of highly anisotropic microstructure, the α⊥ is much larger than the in-plane thermal expansion coefficient α∥ and increases dramatically when the temperature exceeds the glass transition temperature (≈320°C). © 1993 The Minerals, Metals & Materials Society.
T.N. Morgan
Semiconductor Science and Technology
Fernando Marianno, Wang Zhou, et al.
INFORMS 2021
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
Ronald Troutman
Synthetic Metals