Moutaz Fakhry, Yuri Granik, et al.
SPIE Photomask Technology + EUV Lithography 2011
No abstract available.
Moutaz Fakhry, Yuri Granik, et al.
SPIE Photomask Technology + EUV Lithography 2011
M. Tismenetsky
International Journal of Computer Mathematics
Hannaneh Hajishirzi, Julia Hockenmaier, et al.
UAI 2011
John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence