R.R. Haering, A.M. Toxen, et al.
Solid-State Electronics
An instability of the electron concentration is predicted in a semiconductor with a nearly saturating drift velocity and a diffusion constant which increases with increasing electric field. A small signal analysis shows under what conditions fluctuations of the carrier concentration will be unstable. © 1967 The American Institute of Physics.
R.R. Haering, A.M. Toxen, et al.
Solid-State Electronics
W.P. Dumke, M.R. Lorenz, et al.
Physical Review B
W.P. Dumke
Physical Review
W.P. Dumke
IEEE T-ED