J.R. Barnes, A.C.F. Hoole, et al.
Applied Physics Letters
Images of Fresnel fringes have been obtained in the conventional surface scanning electron microscope operating in the transmission mode. These fringes provide a means for critically evaluating instrument resolution, final lens astigmatism, and source brightness. © 1972 The American Institute of Physics.
J.R. Barnes, A.C.F. Hoole, et al.
Applied Physics Letters
R.F. Voss, R.B. Laibowitz, et al.
IEEE Transactions on Magnetics
A.N. Broers
C R C Critical Reviews in Solid State Sciences
A.N. Broers, M. Pomerantz
Thin Solid Films