A.N. Broers, M. Pomerantz
Thin Solid Films
Images of Fresnel fringes have been obtained in the conventional surface scanning electron microscope operating in the transmission mode. These fringes provide a means for critically evaluating instrument resolution, final lens astigmatism, and source brightness. © 1972 The American Institute of Physics.
A.N. Broers, M. Pomerantz
Thin Solid Films
A.N. Broers, E.G. Lean, et al.
Applied Physics Letters
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