A.N. Broers
Journal of Applied Physics
Images of Fresnel fringes have been obtained in the conventional surface scanning electron microscope operating in the transmission mode. These fringes provide a means for critically evaluating instrument resolution, final lens astigmatism, and source brightness. © 1972 The American Institute of Physics.
A.N. Broers
Journal of Applied Physics
F.J. Hohn, T.H.P. Chang, et al.
Journal of Applied Physics
H. Ahmed, A.N. Broers
Journal of Applied Physics
A.N. Broers, P. Coane
Applied Physics Letters