PaperSpecial Correspondence Effect of Randomness in the Distribution of Impurity Ions on FET Thresholds in Integrated ElectronicsRobert W. KeyesIEEE JSSC
PaperThe effect of randomness in the distribution of impurity atoms on FET thresholdsRobert W. KeyesApplied Physics
PaperThe Role of Low Temperatures in the Operation of Logic CircuitryRobert W. Keyes, Erik P. Harris, et al.Proceedings of the IEEE
