IEEE Circuits and Devices Magazine

Paper

01 Jan 1994

Scaling, Small Numbers and Randomness in Semiconductors

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Abstract

No abstract available.

Paper

Miniaturization of electronics and its limits

Robert W. Keyes

IBM J. Res. Dev

Paper

Stress Dependence of the Frequency of Quartz Plates

Robert W. Keyes, Fred W. Blair

Proceedings of the IEEE

Review

Two-level systems in the mechanical properties of silicon at low temperatures

Robert W. Keyes

Physical Review Letters

Paper

Physical problems and limits in computer logic

Robert W. Keyes

IEEE Spectrum

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