ReviewTwo-level systems in the mechanical properties of silicon at low temperaturesRobert W. KeyesPhysical Review Letters
PaperSpecial Correspondence Effect of Randomness in the Distribution of Impurity Ions on FET Thresholds in Integrated ElectronicsRobert W. KeyesIEEE JSSC
PaperTrends in the lattice "combination bands" of zincblende-type semiconductorsRobert W. KeyesThe Journal of Chemical Physics