C.J. Anderson, M. Klein, et al.
IEEE Transactions on Magnetics
Paper
Measurements of the effects of asymmetry in an on-chip regulated power distribution system using a dual trace josephson sampling oscilloscope
Abstract
No abstract available.
Related
Mark Jeffery, T. Van Duzer, et al.
Applied Physics Letters
D. Krökel, D. Grischkowsky, et al.
Applied Physics Letters
M.B. Ketchen, B.J. van der Hoeven, et al.
IEEE Electron Device Letters