Measurements of the effects of asymmetry in an on-chip regulated power distribution system using a dual trace josephson sampling oscilloscope

G.-P. Li, M.B. Ketchen

Advances in Semiconductors and Semiconductor Structures 1987

C.-K. Hu, N.J. Mazzeo, et al.

Thin Solid Films

T.C. Chen, J.D. Cressler, et al.

VLSI Technology 1989

C.J. Anderson, J.H. Magerlein, et al.

GaAs IC 1987