Skip to main content
Research
Focus areas
Blog
Publications
Careers
About
Back
Focus areas
Semiconductors
Artificial Intelligence
Quantum Computing
Hybrid Cloud
Back
About
Overview
Labs
People
Back
Semiconductors
Back
Artificial Intelligence
Back
Quantum Computing
Back
Hybrid Cloud
Back
Overview
Back
Labs
Back
People
Research
Focus areas
Semiconductors
Artificial Intelligence
Quantum Computing
Hybrid Cloud
Blog
Publications
Careers
About
Overview
Labs
People
Open IBM search field
Close
IEEE Transactions on Magnetics
Paper
01 Jan 1981
Measurements of the effects of asymmetry in an on-chip regulated power distribution system using a dual trace josephson sampling oscilloscope
View publication
Abstract
No abstract available.
Related
Paper
A Josephson Technology System Level Experiment
Paper
Direct measurement of jitter in a JTL
Paper
Transmission of high speed electrical signals in a Josephson package
Conference paper
Aggressively scaled (0.143 μm
2
) 6T-SRAM cell for the 32 nm node and beyond
View all publications
