A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
The penetration depth of a magnetic field into a superconducting YBa2Cu3O7-x film was measured by polarized neutron reflection. The sample comprised an epitaxial film with the c-axis of its orthorhombic structure perpendicular to the film's surface. Measurements at 14 K showed that a magnetic field (parallel to the surface) penetrates into the surface over a depth of 1400 Å. © 1989.