F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
Paper
Low temperature effects in Si FETs
Abstract
No abstract available.
Related
Hiroshi Ito, Reinhold Schwalm
JES
John G. Long, Peter C. Searson, et al.
JES
Fernando Marianno, Wang Zhou, et al.
INFORMS 2021