E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
Lithographic aerial images have been studied by digital image simulation. The aspects considered include the variation of numerical aperture, defocus, aberrations, source size, source shape, and source centration. © 1985.
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
Shiyi Chen, Daniel Martínez, et al.
Physics of Fluids
J.K. Gimzewski, T.A. Jung, et al.
Surface Science