Revisit pattern collapse for 14nm node and beyond
Kenji Yoshimoto, Craig Higgins, et al.
SPIE Advanced Lithography 2011
Three dimensional nanostructures are of great interest in photonics and optical sensor communities. Although there are many theoretical models developed, lithographic reduction to practice is an ongoing challenge. Numerous lithographic techniques have been proposed for fabricating three dimensional structures with applications in photonics. We demonstrate a novel three-dimensional electron beam fabrication method that is precise, fast, intrinsically self-aligned and has the ability to produce large area patterns.
Kenji Yoshimoto, Craig Higgins, et al.
SPIE Advanced Lithography 2011
Erik Verduijn, Pawitter Mangat, et al.
SPIE Advanced Lithography 2017
Jed Rankin, Zhengqing John Qi, et al.
SPIE Photomask Technology + EUV Lithography 2015
Ravi Bonam, Scott Halle, et al.
ASMC 2013