Thomas E. Karis, C. Mark Seymour, et al.
Rheologica Acta
We report on the interfacial intermixing of ultrathin Co films on a Cu(001) single crystal, two materials that are immiscible in the bulk. With increasing deposition rate we find a crossover from layer-by-layer to bilayer growth due to a hindered diffusion from the first layer to the substrate. Above two monolayers, growth proceeds in a layer-by-layer fashion. These effects are explained in terms of surface free energies. © 1997 Elsevier Science B.V.
Thomas E. Karis, C. Mark Seymour, et al.
Rheologica Acta
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
P. Alnot, D.J. Auerbach, et al.
Surface Science
O.F. Schirmer, W. Berlinger, et al.
Solid State Communications