M. Arafa, K. Ismail, et al.
IEEE Electron Device Letters
In this letter, we present results of enhancement and depletion mode transistors fabricated on the same layer structure of Si/SiGe, without using gate recess. The current in the enhancement mode device is controlled by a pn-junction, while that of the depletion-mode device is controlled by a Schottky barrier. A peak transconductance of 327 mS/mm and 417 mS/mm has been achieved in 0.5-μm gate length depletion and enhancement-mode transistors, respectively.
M. Arafa, K. Ismail, et al.
IEEE Electron Device Letters
U. Wieser, U. Kunze, et al.
Physica E: Low-Dimensional Systems and Nanostructures
S.J. Koester, R. Hammond, et al.
IEEE Electron Device Letters
P.M. Mooney, L. Tilly, et al.
Journal of Applied Physics