Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Paper
Images of interlayer Josephson vortices in single-layer cuprates
Abstract
The interlayer penetration depth in layered superconductors may be determined from scanning Superconducting QUantum Interference Device (SQUID) microscope images of interlayer Josephson vortices. We compare our findings at 4 K for single crystals of the organic superconductor κ-(BEDT-TTF)2Cu(NCS)2 and three near-optimally doped cuprate superconductors: La2-xSrxCuO4, (Hg,Cu)Ba2CuO4+δ, and Tl2Ba2CuO6+δ. © 2000 Elsevier Science B.V. All rights reserved.
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