Conference paper
SRAM Cell Design for Stability Methodology
Clement Wann, Robert Wong, et al.
VLSI Technology 2005
We report electrical measurements of the radio frequency response of carbon nanotube field-effect transistors (CNFETs). The very low current drive of CNFETs makes conventional high-frequency measurements difficult. To overcome this problem, we have used a novel approach to easily measure the response up to 250 MHz in nonoptimized experimental conditions. We observe a clear response of our CNFETs with no deterioration in signal up to at least 250 MHz, which is the limit for our present configuration.
Clement Wann, Robert Wong, et al.
VLSI Technology 2005
Kerry Bernstein, David J. Frank, et al.
IBM J. Res. Dev
David J. Frank, Yuan Taur, et al.
IEEE Electron Device Letters
H. Miki, N. Tega, et al.
IEDM 2012