Conference paper
Min-log approach to modeling dielectric breakdown data
Emmanuel Yashchin, Baozhen Li, et al.
IRPS 2012
This paper presents formulas for gradients of the Average Run Length (ARL) and other Run Length characteristics by control scheme parameters, in the context of Markov Chain approach to analysis of Markov-type control schemes. We illustrate use of these formulas in several problems related to control charting, including (a) design of control schemes, (b) inference on Run Length characteristics based on Phase-1 data and (c) performance analysis for highly complex input data distributions.
Emmanuel Yashchin, Baozhen Li, et al.
IRPS 2012
Emmanuel Yashchin
COMPSTAT 2010
Emmanuel Yashchin
Technometrics
Yada Zhu, Emmanuel Yashchin, et al.
Technometrics