Betty J. Flehinger, Benjamin Reiser, et al.
Technometrics
This paper presents formulas for gradients of the Average Run Length (ARL) and other Run Length characteristics by control scheme parameters, in the context of Markov Chain approach to analysis of Markov-type control schemes. We illustrate use of these formulas in several problems related to control charting, including (a) design of control schemes, (b) inference on Run Length characteristics based on Phase-1 data and (c) performance analysis for highly complex input data distributions.
Betty J. Flehinger, Benjamin Reiser, et al.
Technometrics
Mary Y.L. Wisniewski, Emmanuel Yashchin, et al.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Yada Zhu, Robert J. Baseman, et al.
ISSAT-RQD 2012
Emmanuel Yashchin
IBM J. Res. Dev