Appl Stochastic Models Bus Indus

Editorial

27 Apr 2020

Foreword: Special issue on statistics in quality, industry, and technology

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Conference paper

Defining the controlling parameter in constrained discriminative linear transform for supervised speaker adaptation

Danning Jiang, Dimitri Kanevsky, et al.

ICASSP 2011

Conference paper

Minimum void size and 3-parameter lognormal distribution for em failures in Cu interconnects

Baozhen Li, Cathryn Christiansen, et al.

IRPS 2006

Paper

Analysis of cusum and other markov-type control schemes by using empirical distributions

Emmanuel Yashchin

Technometrics

Paper

Threshold electromigration failure time and its statistics for Cu interconnects

Baozhen Li, Cathryn Christiansen, et al.

Journal of Applied Physics

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