Appl Stochastic Models Bus Indus

Editorial

27 Apr 2020

Foreword: Special issue on statistics in quality, industry, and technology

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Paper

Modeling of risk losses using size-biased data

Emmanuel Yashchin

IBM J. Res. Dev

Paper

Modeling and forecasting of defect-limited yield in semiconductor manufacturing

Michael Baron, Asya Takken, et al.

IEEE Trans Semicond Manuf

Paper

Comments on Wardell, Moskowitz, and Plante (1994)

Emmanuel Yashchin

Technometrics

Paper

Discussion of recent advances in process monitoring: Nonparametric and variable-selection methods for phase i and phase II

Emmanuel Yashchin

Quality Engineering

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