Conference paper
Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
The thin-film-transistor liquid crystal display (TFT/LCD) is emerging as the leading flat-panel display in computer applications. TFT array characterization is important to the research, development, and manufacturing of TFT/LCDs. This paper describes a new Dynamic Array Tester developed for that purpose and describes some examples of its use.
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Sabine Deligne, Ellen Eide, et al.
INTERSPEECH - Eurospeech 2001
Sonia Cafieri, Jon Lee, et al.
Journal of Global Optimization
Thomas M. Cheng
IT Professional