Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001
Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B