S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
Steady state and switching behavior of single luminescence filaments in a-BaTiO3/ZnS/a-BaTiO3 ac thin film electroluminescence devices have been studied. The brightness-voltage amplitude hysteresis, or memory effect, of these devices results from the ensemble behavior of luminescing filaments that are bistable in their luminescence level. A trap depth of 1-1.2eV is estimated on the assumption that the voltage threshold for luminescence involves electric field emission from traps. The temperature dependence of electroluminescence near the threshold voltage is investigated. © 1979 AIME.
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
O.F. Schirmer, W. Berlinger, et al.
Solid State Communications
T. Schneider, E. Stoll
Physical Review B
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B