Nicolas Bonod, Sebastien Bidault, et al.
Advanced Optical Materials
Review
Fair and Comprehensive Benchmarking of Machine Learning Processing Chips
Abstract
This article provides an overview of benchmarking strategies at a different set of abstraction levels and related best practices in each, while working to also give an overall view of impact.
Related
Louis P. Romero, Stefano Ambrogio, et al.
Faraday Discussions
Alvaro Padilla, Geoffrey W. Burr, et al.
IEEE T-ED
Geoffrey W. Burr, Matthew BrightSky, et al.
IEEE JESTCS