M. Heiblum, D.C. Thomas, et al.
Applied Physics Letters
A novel method involving internal photoemission has been developed to determine the conduction band discontinuity Δ Ec of heterojunctions. The method is straightforward, accurate, and assumes minimum unknowns; and has been applied to GaAs/AlxGa1-xAs heterojunctions. We have found for x<0.4 that Δ Ec≅0.62 Δ Eg, where Δ Eg is the band-gap difference. For x>0.4, the apparent Δ Ec is considerably smaller.
M. Heiblum, D.C. Thomas, et al.
Applied Physics Letters
A. Palevski, C.P. Umbach, et al.
Applied Physics Letters
M. Heiblum, K. Seo, et al.
Physical Review Letters
U. Sivan, M. Heiblum, et al.
Physical Review Letters