T.J. De Lyon, J. Woodall, et al.
Applied Physics Letters
The light-emitting diodes described in this Letter differ from standard type diodes insofar as the amphoteric dopant Si is the dominant impurity on both sides of the junction. The p-n junction is completely solution regrown. The highly compensated p region gives rise to a wide active region up to 50 μ in width. The interesting feature of these diodes is their high external quantum efficiencies at 300°K. Values up to 6% have been measured on diodes, when an antireflecting coat has been applied. © 1966 The American Institute of Physics.
T.J. De Lyon, J. Woodall, et al.
Applied Physics Letters
J. Freeouf, Alan C. Warren, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
D.D. Nolte, M.R. Melloch, et al.
Applied Physics Letters
H.J. Hovel, J. Woodall
Applied Physics Letters