Conference paper
Statistical data reduction lor manufacturing testing
Sakti P. Ghosh
ICDE 1986
No abstract available.
Sakti P. Ghosh
ICDE 1986
Edward G. Grochowski, Roger F. Hoyt, et al.
IEEE Transactions on Magnetics
Sakti P. Ghosh
IEEE TKDE
Sakti P. Ghosh
CACM