Dynamic recrystallization during high temperature fatigue

T.C. Reiley, L.-S. Fan, et al.

Microelectronic Engineering

V. Raman, T.C. Reiley

Journal of Materials Science Letters

P.H. Kasai, V. Raman

Tribology Letters

T.C. Reiley, T.R. Albrecht, et al.

INVMTC 1996