A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Paper
Dissociation kinetics of hydrogen-passivated (100) Si SiO2 interface defects
Abstract
No abstract available.
Related
Ellen J. Yoffa, David Adler
Physical Review B
T. Schneider, E. Stoll
Physical Review B
J.R. Thompson, Yang Ren Sun, et al.
Physica A: Statistical Mechanics and its Applications