L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
A technique is described whereby the direct observation of structural changes resulting from electrical switching can be followed in an electron microscope. It is applied to the amorphous chalcogenide alloys and a brief description of the filament that is formed is presented. © 1972.
L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery