David S. Kung
DAC 1998
MRAM (magnetic random access memory) technology, based on the use of magnetic tunnel junctions (MTJs) as memory elements, is a potentially fast nonvolatile memory technology with very high write endurance. This paper is an overview of MRAM design considerations. Topics covered include MRAM fundamentals, array architecture, several associated design studies, and scaling challenges. In addition, a 16-Mb MRAM demonstration vehicle is described, and performance results are presented. ©Copyright 2006 by International Business Machines Corporation.
David S. Kung
DAC 1998
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Thomas R. Puzak, A. Hartstein, et al.
CF 2007
Elena Cabrio, Philipp Cimiano, et al.
CLEF 2013