H.D. Dulman, R.H. Pantell, et al.
Physical Review B
We report on the fabrication of diamond and silicon refractive X-ray lenses. These are made using e-beam lithography and deep reactive ion etching. The diamond lenses are promising candidates for optics meeting the extreme requirements of planned X-ray sources based on the free electron laser principle. The silicon lenses are well suited for micro-focusing applications at hard X-ray energies above 20 keV. We measured efficiencies up to 78% and a width of the line-focus down to 3 μm for these lenses. The possibility to compensate for lens aberrations using stacked lenses is discussed. A simple method for the stacking of two silicon devices (lenses) by means of micro-mechanical alignment marks is shown, giving an alignment accuracy in the micron range. © 2003 Elsevier Science B.V. All rights reserved.
H.D. Dulman, R.H. Pantell, et al.
Physical Review B
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009