J. Tersoff
Applied Surface Science
Paper
Cyclotron mass of two-dimensional holes in strained Si/Si0.88Ge0.12/Si heterostructures
Abstract
We have observed cyclotron resonance of the two-dimensional holes in strained layer Si/Si0.88Ge0.12/Si heterostructures with densities ps=3.7×1011cm-2 and 4.2×1011cm-2 in magnetic fields from 4T to 8T at 4.2K. Our data yield a mass value of (0.18±0.02)me, in good agreement with the calculated in-plane mass of the MJ=± 3 2 "heavy hole" band. © 1995.
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