Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
Much recent research aimed at developing high temperature Josephson junctions for electronics applications is based on superconductor-normal metal-superconductor (SNS) edge junctions which, in some instances, exhibit excellent current-voltage characteristics, high critical current-resistance products, and low noise: We review the data available in the published literature and conclude that, despite the useful performance of these junctions, there is little evidence that the behavior of most reported high-Tc SNS devices can be described by conventional proximity effect theory. © 1995 IEEE
Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics