Ming L. Yu
Physical Review B
ESD robustness of 4 kV HBM is achieved in CMOS-on-SOI ESD protection networks in an advanced sub-0.25 μm mainstream CMOS-on-SOI technology. Design layout, body contact, floating-gate effects and novel ESD protection implementations are discussed. © 1998 Elsevier Science B.V.
Ming L. Yu
Physical Review B
Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
Robert W. Keyes
Physical Review B