R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP
ESD robustness of 4 kV HBM is achieved in CMOS-on-SOI ESD protection networks in an advanced sub-0.25 μm mainstream CMOS-on-SOI technology. Design layout, body contact, floating-gate effects and novel ESD protection implementations are discussed. © 1998 Elsevier Science B.V.
R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP
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IEDM 1998
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