B.A. Hutchins, T.N. Rhodin, et al.
Surface Science
We have measured the cluster-size distribution in thin Al-Al2O3 films near the metal-insulator transition for sheet resistances of about 1000 Ω and metal area fraction of the order of 0.5. Our results show for the first time that this distribution follows a power-law dependence and that the perimeter-to-area ratio is approximately constant for large clusters. We find good quantitative agreement between our obseryations and the predictions of percolation theory. © 1982 The American Physical Society.
B.A. Hutchins, T.N. Rhodin, et al.
Surface Science
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT
Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
I. Morgenstern, K.A. Müller, et al.
Physica B: Physics of Condensed Matter