Conference paper
EMI Generated EOS in a Wire-bonder
Icko Eric Timothy Iben, Vladimir Kraz, et al.
EOS/ESD 2017
Auditing a manufacturing facility which assembles devices with magnetoresistive readers requires finding and eliminating sources of both ESD and EOS pulses at levels below 1 V. A Discharge Event Audit tool was made to observe ESD and EOS pulses occur in tape head manufacturing line using MR readers. © 2013 ESD Association.
Icko Eric Timothy Iben, Vladimir Kraz, et al.
EOS/ESD 2017
Icko Eric Timothy Iben, Dylan Boday, et al.
EOS/ESD 2012
Michelle Lam, Icko Eric Timothy Iben, et al.
EOS/ESD 2009
James Di Sarro, Bill Reynold, et al.
EOS/ESD 2013