Ming L. Yu
Physical Review B
Paper
Atomic-force microscopy
Abstract
Atomic-Force Microscopy (AFM) is a promising new method for studying the surface structure of both conductors and insulators. Up to now, atomic resolution has been achieved on graphite. © IOP Publishing Ltd.
Related
Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
P.C. Pattnaik, D.M. Newns
Physical Review B
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT