Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
Paper
Atomic-force microscopy
Abstract
Atomic-Force Microscopy (AFM) is a promising new method for studying the surface structure of both conductors and insulators. Up to now, atomic resolution has been achieved on graphite. © IOP Publishing Ltd.
Related
Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
Julien Autebert, Aditya Kashyap, et al.
Langmuir