Atomic-force microscopy

G. Binnig

doi:10.1088/0031-8949/1987/T19A/008

Physica Scripta

Paper

14 Feb 2007

Atomic-force microscopy

View publication

Abstract

Atomic-Force Microscopy (AFM) is a promising new method for studying the surface structure of both conductors and insulators. Up to now, atomic resolution has been achieved on graphite. © IOP Publishing Ltd.

Paper

On Fitting Error Functions to Data

R. Ghez, M.B. Small

JES

Conference paper

NEW RELIABLE STRUCTURE FOR HIGH TEMPERATURE MEASUREMENT OF SILICON WAFERS USING A SPECIALLY ATTACHED THERMOCOUPLE.

S. Cohen, T.O. Sedgwick, et al.

MRS Proceedings 1983

Paper

Soft x-ray investigation of the effect of growth conditions on InAs/GaAs heterostructures

A. Krol, C.J. Sher, et al.

Surface Science

Paper

Pair and triplet interactions in argon

J.A. Barker, D. Henderson, et al.

Molecular Physics

View all publications

Abstract

Related

On Fitting Error Functions to Data

NEW RELIABLE STRUCTURE FOR HIGH TEMPERATURE MEASUREMENT OF SILICON WAFERS USING A SPECIALLY ATTACHED THERMOCOUPLE.

Soft x-ray investigation of the effect of growth conditions on InAs/GaAs heterostructures

Pair and triplet interactions in argon