J.L. Sanford, P.F. Greier, et al.
IBM J. Res. Dev
Electron diffraction patterns generated from phases that have low crystallographic symmetry are difficult and tedious to analyze by conventional techniques. This paper describes a computation scheme that can index electron diffraction patterns efficiently and quickly and be easily implemented on a personal computer. The technique is based on sorting and searching and is especially useful when rapid analyses of electron diffraction patterns are necessary and the crystalline phase under study has a low symmetry. Copyright © 1986 Wiley‐Liss, Inc.
J.L. Sanford, P.F. Greier, et al.
IBM J. Res. Dev
F.E. Doany, C. Narayan
IBM J. Res. Dev
S. Purushothaman, S.V. Nitta, et al.
Technical Digest-International Electron Devices Meeting
W.R. Tonti, J.A. Fifield, et al.
IRPS 2004