Alina Deutsch, Paul W. Coteus, et al.
Proceedings of the IEEE
An electrical probe based on specially designed coaxial tips is shown to have 24-GHz bandwidth. It can be used to test high-speed signal propagation on planar or nonplanar chip or package interconnection structures with signal/ground pads as small as 50 µm. The detailed fabrication procedure, characterization, and use of the probe are presented. A variation of the design has 500-Ω input impedance and a bandwidth of 19 GHz. © 1990 IEEE
Alina Deutsch, Paul W. Coteus, et al.
Proceedings of the IEEE
Alan Gara, Matthias A. Blumrich, et al.
IBM J. Res. Dev
Mark E. Giampapa, Ralph Bellofatto, et al.
IBM J. Res. Dev
Alina Deutsch, Roger S. Krabbenhoft, et al.
IEEE Trans Electromagn Compat