Alan Gara, Matthias A. Blumrich, et al.
IBM J. Res. Dev
An electrical probe based on specially designed coaxial tips is shown to have 24-GHz bandwidth. It can be used to test high-speed signal propagation on planar or nonplanar chip or package interconnection structures with signal/ground pads as small as 50 µm. The detailed fabrication procedure, characterization, and use of the probe are presented. A variation of the design has 500-Ω input impedance and a bandwidth of 19 GHz. © 1990 IEEE
Alan Gara, Matthias A. Blumrich, et al.
IBM J. Res. Dev
Alina Deutsch, Thomas-Michael Winkel, et al.
IEEE Transactions on Advanced Packaging
I.M. Abe Elfadel, Alina Deutsch, et al.
IEEE Transactions on Advanced Packaging
Alina Deutsch, Christopher W. Surovic, et al.
IEEE Transactions on Advanced Packaging