A comparison of grain size measurements in Al-Cu thin films: Imaging verses diffraction techniques

P.J. Ding, W.A. Lanford, et al.

Nuclear Inst. and Methods in Physics Research, B

J.M.E. Harper, K.P. Rodbell, et al.

MRS Spring Meeting 1997

J.M.E. Harper, C. Cabral Jr., et al.

MRS Spring Meeting 1999

R. Filippi, J.F. McGrath, et al.

IRPS 2004