C. Brothers, R. Pugh, et al.
IEEE TNS
0.25 μm SOI-CMOS ring oscillators, various circuits and SRAM from 8-inch SIMOX wafers are reported. Both active power and stand-by leakage are compared on fully integrated lots for both SOI and bulk materials. The great advantage of SOI for active power reduction are demonstrated for various circuits. Stand-by leakage paths had been systematically studied on their dependence on material, process integration and devices. Potential solutions to reduce each stand-by leakage current are discussed. From these early 8- inch SIMOX materials, encouraging results suggest that low stand-by power can be achieved by optimizations of SOI material preparation, process integration and device design.
C. Brothers, R. Pugh, et al.
IEEE TNS
Mukesh Khare, S. Ku, et al.
IEDM 2002
E. Leobandung, M. Sherony, et al.
IEDM 1998
L. Su, S. Subbanna, et al.
VLSI Technology 1996