Publications

3 results at Canadian Metallurgical Quarterly

Correlation between special grain boundaries and electromigration behavior of aluminum thin films
- - K.T. Lee
  - J.A. Szpunar
  - et al.
- 1995
- Canadian Metallurgical Quarterly
Correlation between special grain boundaries and electromigration behavior of aluminum thin films
- - K.T. Lee
  - J.A. Szpunar
  - et al.
- 1995
- Canadian Metallurgical Quarterly
Diffusion phenomena in microelectronic metallizations and interconnections
- - D. Gupta
- 1995
- Canadian Metallurgical Quarterly