STM study on two-dimensional electronic system localized on surfaces
- Yukio Hasegawa
- Whan Lyo
- et al.
- 1997
- Science Reports of the Rerearch Institutes Tohoku University Series A-Physics
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2 results at Science Reports of the Rerearch Institutes Tohoku University Series A-Physics
Structural study of SiOx amorphous thin films by the grazing incidence X-ray scattering (GIXS) method
- Eiichiro Matsubara
- Kunioki Kato
- et al.
- 1996
- Science Reports of the Rerearch Institutes Tohoku University Series A-Physics